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3D Optical Microscopy: Correlating Industrial Surface Metrology to Enhanced Product Performance
On-Demand Until: November 16, 2012
Speaker: Matt Novak, Ph.D., Applications Manager, Bruker Nano Surfaces Division
Sponsored by: Bruker Nano
CLICK HERE to register or View a Replay
CAD-Based Inspection using Contact Measurement
On-Demand Until: August 9, 2012
Speakers: Cedric Morris, Senior Applications Engineer, FARO
Sponsored by: FARO
CLICK HERE to register or View a Replay
Measurement 101: Essential Knowledge
On-Demand Until: June 16, 2012
Speakers: George Schuetz, Director of Precision Gages; Kurt Braun, Vice President of Sales
Sponsored by: Mahr Federal
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Eddy Current Testing: Its Many Benefits and Applications
On-Demand Until: June 14, 2012
Speakers: Eric Blackwell, Sales Engineer GA / SC / Western NC / Eastern TN / North FL Territory, Olympus NDT; Lee Nye, Technical Support - Americas, Olympus NDT
Sponsored by: Olympus NDT
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Reducing Warranty Costs through Quantification of Machined Lead Angle and Surface Characteristics of Rotary Seals
On-Demand Until: May 16, 2012
Speakers: Andrew Masters, Vice President, Strategic Marketing and Business Development, Bruker Nano Surfaces Business; Erik Novak, Director, Technology Development, Bruker Nano Surfaces Business
Sponsored by: Bruker Nano
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How can Optical Measurement Improve Industrial QC?
On-Demand Until: May 12, 2012
Speakers: Daniel Brown, Product Manager - Handyscan 3D / MetraSCAN; Jean-Francois Larue, HandyPROBE Product Director
Sponsored by: Creaform
CLICK HERE to register or View a Replay
The Metrotom CMM: A Unique Metrology Solution
On-Demand Until: April 20, 2012
Speaker: Kevin Legacy, Manager of Computed Tomography & Engineering, Carl Zeiss
Sponsored by: Carl Zeiss
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Introduction to Precision Ultrasonic thickness Gages and Applications
On-Demand Until: February 23, 2012
Speakers: Peter Kaszuba, Technical Sales Engineer, Olympus NDT; Tom Nelligan, Senior Applications Engineer, Olympus NDT
Sponsored by: Olympus NDT
CLICK HERE to register or View a Replay
